A Method of Analog IC Placement with Common Centroid Constraints

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Author(s)

    • UE Keitaro
    • Department of Electrical and Electronic Engineering, Tokyo University of Agriculture and Technology
    • FUJIYOSHI Kunihiro
    • Department of Electrical and Electronic Engineering, Tokyo University of Agriculture and Technology

Abstract

To improve immunity against process gradients, a <i>common centroid constraint</i>, in which every pair of capacitors should be placed symmetrically with respect to a common center point, is widely used. The pair of capacitors are derived by dividing some original capacitors into two halves. Xiao et al. proposed a method to obtain a placement which satisfies the common centroid constraints, but this method has a defect. In this paper, we propose a decoding algorithm to obtain a placement which satisfies common centroid constraints.

Journal

  • IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences

    IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences E97.A(1), 339-346, 2014

    The Institute of Electronics, Information and Communication Engineers

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