Focusing of Soft X-rays Using Poly-capillary with Precise Adjustment Mechanism and Its Application to Quick Chemical-state Analysis
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- HIRAO Norie
- Japan Atomic Energy Agency
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- BABA Yuji
- Japan Atomic Energy Agency
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- SEKIGUCHI Tetsuhiro
- Japan Atomic Energy Agency
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- SHIMOYAMA Iwao
- Japan Atomic Energy Agency
Bibliographic Information
- Other Title
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- 微調整機構付きポリキャピラリーを用いた軟X線の集光とその高速化学状態分析への応用
- ビチョウセイ キコウ ツキ ポリキャピラリー オ モチイタ ナンXセン ノ シュウコウ ト ソノ コウソク カガク ジョウタイ ブンセキ エ ノ オウヨウ
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Abstract
A method for quick and real-time observations of a solid surface at nanometer scale is described. The principle of the method is as follows. Soft X-rays from a synchrotron light source are irradiated on a solid surface, and the total photoelectrons are expanded and focused on a screen using electrostatic lenses. When the energy of X-rays is scanned and the brightness is plotted, we can obtain micro X-ray absorption (micro-XAFS) spectra in all regions of the image. The spacial resolution of the method was 40 nm. In order to more quickly observe a microscopic image and measure micro-XAFS spectra, the soft X-rays from the bending magnet were focused using a newly developed poly-capillary. As a result, we succeeded in observing a clear image at 10 ms for a bulk sample. We have also tried to shorten the measuring time of the micro-XAFS spectrum. For a Si-SiO2 sample, it has been demonstrated that micro-XAFS spectra in all regions of an image can be obtained in the order of 10 sec. It is concluded that real-time observations of chemical-states at nanometer scale are possible by the present method.
Journal
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- BUNSEKI KAGAKU
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BUNSEKI KAGAKU 63 (1), 53-58, 2014
The Japan Society for Analytical Chemistry
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Details 詳細情報について
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- CRID
- 1390001204661041408
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- NII Article ID
- 130003391213
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- NII Book ID
- AN00222633
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- COI
- 1:CAS:528:DC%2BC2cXitV2qt74%3D
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- NDL BIB ID
- 025173853
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- ISSN
- 05251931
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- Text Lang
- ja
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- Data Source
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- JaLC
- IRDB
- NDL
- Crossref
- CiNii Articles
- KAKEN
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- Abstract License Flag
- Disallowed