フェムト秒時間分解電子顕微鏡の研究  [in Japanese] Femtosecond Time-resolved Electron Microscopy  [in Japanese]

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Author(s)

Abstract

The revealing and understanding of ultrafast structural-change induced dynamics are essential not only in physics, chemistry and biology, but also are indispensable for the development of new materials, new devices and applications. A new radio-frequency electron gun based ultrafast relativistic electron microscopy (UEM) has being developed in Osaka University to probe directly structural changes at the atomic scale with sub-100 fs temporal resolution in materials. The first prototype of femtosecond time-resolved relativistic-energy UEM has been constructed at end of October in 2012. Both relativistic-energy electron diffraction and image measurements have been succeeded using a femtosecond electron beam. In this paper, the development of the UEM prototype and the first experiments of relativistic-energy electron imaging were reported.

Journal

  • IEEJ Transactions on Electronics, Information and Systems

    IEEJ Transactions on Electronics, Information and Systems 134(4), 515-520, 2014

    The Institute of Electrical Engineers of Japan

Codes

  • NII Article ID (NAID)
    130003391753
  • NII NACSIS-CAT ID (NCID)
    AN10065950
  • Text Lang
    JPN
  • ISSN
    0385-4221
  • NDL Article ID
    025468421
  • NDL Call No.
    Z16-795
  • Data Source
    NDL  J-STAGE 
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