フェムト秒時間分解電子顕微鏡の研究 Femtosecond Time-resolved Electron Microscopy

この論文にアクセスする

この論文をさがす

著者

抄録

The revealing and understanding of ultrafast structural-change induced dynamics are essential not only in physics, chemistry and biology, but also are indispensable for the development of new materials, new devices and applications. A new radio-frequency electron gun based ultrafast relativistic electron microscopy (UEM) has being developed in Osaka University to probe directly structural changes at the atomic scale with sub-100 fs temporal resolution in materials. The first prototype of femtosecond time-resolved relativistic-energy UEM has been constructed at end of October in 2012. Both relativistic-energy electron diffraction and image measurements have been succeeded using a femtosecond electron beam. In this paper, the development of the UEM prototype and the first experiments of relativistic-energy electron imaging were reported.

収録刊行物

  • 電気学会論文誌. C

    電気学会論文誌. C 134(4), 515-520, 2014

    一般社団法人 電気学会

各種コード

  • NII論文ID(NAID)
    130003391753
  • NII書誌ID(NCID)
    AN10065950
  • 本文言語コード
    JPN
  • ISSN
    0385-4221
  • NDL 記事登録ID
    025468421
  • NDL 請求記号
    Z16-795
  • データ提供元
    NDL  J-STAGE 
ページトップへ