A Body Bias Generator with Low Supply Voltage for Within-Die Variability Compensation

  • KAMAE Norihiro
    Department of Communications and Computer Engineering, Graduate School of Informatics, Kyoto University
  • TSUCHIYA Akira
    Department of Communications and Computer Engineering, Graduate School of Informatics, Kyoto University
  • ONODERA Hidetoshi
    Department of Communications and Computer Engineering, Graduate School of Informatics, Kyoto University CREST, JST

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Abstract

A body bias generator (BBG) for fine-grained body biasing (FGBB) is proposed. The FGBB is effective to reduce variability and power consumption in a system-on-chip (SoC). Since FGBB needs a number of BBGs, the BBG is preferred to be implemented in cell-based design procedure. In the cell-based design, it is inefficient to provide an extra supply voltage for BBGs. We invented a BBG with switched capacitor configuration and it enables BBG to operate with wide range of the supply voltage from 0.6V to 1.2V. We fabricated the BBG in a 65nm CMOS process to control 0.1mm2 of core circuit with the area overhead of 1.4% for the BBG.

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