Analysis of Radiation-Induced Clock-Perturbation in Phase-Locked Loop

• KIM SinNyoung

  Department of Communications and Computer Engineering, Kyoto University

• TSUCHIYA Akira

  Department of Communications and Computer Engineering, Kyoto University

• ONODERA Hidetoshi

  Department of Communications and Computer Engineering, Kyoto University JST, CREST

Abstract

This paper presents an analysis of radiation-induced clock-perturbation in phase-locked loop (PLL). Due to a trade-off between cost, performance, and reliability, radiation hardened PLL design need robust strategy. Thus, evaluation of radiation vulnerability is important to choose the robust strategy. The conventional evaluation-method is however based on brute-force analysis — SPICE simulation and experiment. The presented analysis result eliminates the brute-force analysis in evaluation of the radiation vulnerability. A set of equations enables to predict the radiation-induced clock-perturbation at the every sub-circuits. From a demonstration, the most vulnerable nodes have been found, which are validated using a PLL fabricated with 0.18µm CMOS process.

Journal

• IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences

  IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences E97.A (3), 768-776, 2014

  The Institute of Electronics, Information and Communication Engineers

Keywords

• radiation-hardened phase-locked loop (RH-PLL)
• soft error
• clock-perturbation model

Details

• CRID: 1390282681286718976
• NII Article ID: 130003394780
• NII Article ID: 40019997293
• NII Book ID: AA10826239
• DOI: 10.1587/transfun.e97.a.768
• ISSN: 17451337
• ISSN: 09168508
• NDL BIB ID: 025304489
• Web Site: https://ndlsearch.ndl.go.jp/books/R000000004-I025304489
• Web Site: https://www.jstage.jst.go.jp/article/transfun/E97.A/3/E97.A_768/_pdf
• Text Lang: en
• Data Source:
  • JaLC
  • NDL
  • Crossref
  • CiNii Articles
  • KAKEN
• Abstract License Flag: Disallowed