Surface Conductance of Metal Surfaces in Air Studied with a Force Microscope

• Morita Seizo

  Department of Electronic Engineering, Faculty of Engineering, Iwate University

• Ishizaka Tatsuya

  Research Institute of Electrical Communication, Tohoku University

• Sugawara Yasuhiro

  Department of Electronic Engineering, Faculty of Engineering, Iwate University

• Okada Takao

  Olympus Optical Co., Ltd.

• Mishima Syuzo

  Olympus Optical Co., Ltd.

• Imai Syozo

  Research Institute of Electrical Communication, Tohoku University

• Mikoshiba Nobuo

  Research Institute of Electrical Communication, Tohoku University

抄録

With a force microscope, the surface conductances of various metals in air were investigated by measuring both the contact force and the current between the metal surface and the W lever simultaneously. When the Ag surface approached the W lever, current began to flow only in the strong repulsive-force range in contrast to the Au surface, so that the Ag surface seemed to be oxidized slightly. In the case of the Ti surface, current was not observed even in the strong repulsive-force range, so that the Ti surface seemed to be oxidized thick enough to sustain this strong repulsive force.

収録刊行物

• Japanese Journal of Applied Physics

  Japanese Journal of Applied Physics 28 (9), L1634-L1636, 1989

  公益社団法人 応用物理学会

キーワード

• surface conductance
• force microscope
• metal surface
• scanning tunneling microscope
• effective oxide thickness
• contact force
• tunneling current

詳細情報

• CRID: 1573668927890927616
• NII論文ID: 130003469465
• ISSN: 00214922
• Web Site: https://jlc.jst.go.jp/DN/JALC/00337535848?from=CiNii
• 本文言語コード: en
• データソース種別:
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