Growth Characteristics of Thin Foil Martensites in an Fe-4.1%Mn-1.25%C Alloy

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The growth characteristics of martensites in thin foils of an Fe-4.1 mass%Mn-1.25 mass%C alloy have been investigated by means of transmission electron microscopy with a cooling stage. Thin foil martensites are formed instantly by cooling below Ms temperature as in bulk specimens. In the regions where the martensites are small and/or less affected from other neighboring martensites, they are surrounded by a sharp planar and diffuse little curved interfaces, the former being consistent with a {225} plane which has been known as the habit plane for bulk martensites. The martensite crystals grow upon further cooling and/or irradiation with electron beams, only one interface advancing. Upon growth, planar or curved interface is sometimes curved or straighten, respectively, depending on stress or strain field from neighboring martensites. However, both originally and subsequently curved interfaces are finally straighten when they reach or join to the interface of other martensites, and thus the tip of thin foil martensites comes to be formed with two straight interfaces; {225} habit plane and another {225} plane. It is considered from these observations that thin foil ferrous martensites nucleate to satisfy the invariant plane strain condition as in bulk specimens, although they take a curved or irregular interface during the growth.

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