Atom Selective Imaging and Mechanical Atom Manipulation based on Noncontact Atomic Force Microscope Method

DOI Web Site 参考文献32件
  • Morita Seizo
    Department of Electronic Engineering, Graduate School of Engineering, Osaka University Handai Frontier Research Center (FRC)
  • Oyabu Noriaki
    Department of Electronic Engineering, Graduate School of Engineering, Osaka University Handai Frontier Research Center (FRC)
  • Nishi Ryuji
    Department of Electronic Engineering, Graduate School of Engineering, Osaka University
  • Okamoto Kenji
    Department of Electronic Engineering, Graduate School of Engineering, Osaka University
  • Abe Masayuki
    Department of Electronic Engineering, Graduate School of Engineering, Osaka University
  • Custance Óscar
    Handai Frontier Research Center (FRC)
  • Yi Insook
    Handai Frontier Research Center (FRC)
  • Seino Yoshihide
    Handai Frontier Research Center (FRC)
  • Sugawara Yasuhiro
    Department of Applied Physics, Graduate School of Engineering, Osaka University Handai Frontier Research Center (FRC)

抄録

We investigated performances and functions of the noncontact atomic force microscope (NC-AFM) method. As a result, we found that the NC-AFM functions not only as the atomic resolution microscope but also novel atomic tools based on a mechanical method as follows; a three-dimensional mapping tool of atomic force between the tip and sample atoms, a discrimination tool of atomic force mechanisms and atom species of the sample surface, a control tool of atomic force and atom position on the sample surface, and an atom manipulation tool. [DOI: 10.1380/ejssnt.2003.158]

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