XAFS and XMCD Spectra at the Surface and Interface of Ultrathin Films Observed by the Depth-Resolved XAFS/XMCD Technique

• Amemiya Kenta

  Institute of Materials Structure Science, High Energy Accelerator Research Organization, Japan

• Sakamaki Masako

  Institute of Materials Structure Science, High Energy Accelerator Research Organization, Japan

Abstract

A depth-resolved X-ray absorption fine structure (XAFS) technique has been developed by using the detection-angle dependence of the effective escape depth of the Auger electrons in the electron-yield XAFS measurement. The technique is applied to a Ni thin film covered with oxygen adsorbates in order to extract the XAFS and X-ray magnetic circular dichroism (XMCD) spectra at the surface layer. The chemical state and the magnetic structure of the surface layer are clarified from the extracted XAFS/XMCD spectra. [DOI: 10.1380/ejssnt.2012.521]

Journal

• e-Journal of Surface Science and Nanotechnology

  e-Journal of Surface Science and Nanotechnology 10 (0), 521-524, 2012

  The Japan Society of Vacuum and Surface Science

Keywords

• X-ray Absorption Fine Structure (XAFS)
• X-ray Magnetic Circular Dichroism (XMCD)
• Depth-Resolved Technique
• Surface and Interface
• Magnetic Thin Films

Details

• CRID: 1390282680162152832
• NII Article ID: 130004438839
• DOI: 10.1380/ejssnt.2012.521
• ISSN: 13480391
• Web Site: https://www.jstage.jst.go.jp/article/ejssnt/10/0/10_521/_pdf
• Text Lang: en
• Data Source:
  • JaLC
  • Crossref
  • CiNii Articles
  • KAKEN
• Abstract License Flag: Disallowed