Hydrogen Response of Pd Schottky Diodes Formed on AlGaN/GaN Heterostructure
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- Matsuo Kazushi
- Research Center for Integrated Quantum Electronics (RCIQE), Hokkaido University, Japan
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- Kimura Takeshi
- Research Center for Integrated Quantum Electronics (RCIQE), Hokkaido University, Japan
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- Hasegawa Hideki
- Research Center for Integrated Quantum Electronics (RCIQE), Hokkaido University, Japan
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- Hashizume Tamotsu
- Research Center for Integrated Quantum Electronics (RCIQE), Hokkaido University, Japan
抄録
Basic H2 gas-sensing characteristics of Pd Schottky diodes formed on the AlGaN/GaN heterostructure were investigated in vacuum. By introducing a novel surface control process to reduce reverse leakage currents, an unprecedented high H2 sensitivity was achieved where 1 Torr hydrogen caused five orders of magnitude change of current. Surprisingly, the surface control process did not change the C-V characteristics which showed an unexpectedly large shift 1000 mV on H2 exposure. Transient waveforms were almost exponential for the logarithm of current, and response speed increased with increase of H2 pressure and temperature. These results were explained in terms of Schottky barrier height due to adsorption of atomic hydrogen generated by Pd together with a due consideration of the current transport mechanism under reverse bias. [DOI: 10.1380/ejssnt.2005.314]
収録刊行物
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- e-Journal of Surface Science and Nanotechnology
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e-Journal of Surface Science and Nanotechnology 3 314-318, 2005
公益社団法人 日本表面真空学会
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詳細情報 詳細情報について
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- CRID
- 1390282680163694208
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- NII論文ID
- 130004438957
- 30006881991
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- ISSN
- 13480391
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- 本文言語コード
- en
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- データソース種別
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- JaLC
- Crossref
- CiNii Articles
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- 抄録ライセンスフラグ
- 使用不可