Demountable Single-Atom Electron Source
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- Oshima Chuhei
- Department of Applied Physics, Waseda University, Japan Kagami Memorial Laboratory for Material Science and Technology, Waseda University, Japan
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- Rokuta Eiji
- Department of Applied Physics, Waseda University, Japan Kagami Memorial Laboratory for Material Science and Technology, Waseda University, Japan
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- Ishikawa Tsuyosi
- Department of Applied Physics, Waseda University, Japan Kagami Memorial Laboratory for Material Science and Technology, Waseda University, Japan
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- Cho Bokurai
- Department of Applied Physics, Waseda University, Japan Kagami Memorial Laboratory for Material Science and Technology, Waseda University, Japan
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- Kuo Hong-Shi
- Institute of Physics, Academia Scinica
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- Hwang Ing-Shouh
- Institute of Physics, Academia Scinica
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- Tsong Tien T.
- Institute of Physics, Academia Scinica
Abstract
We report emission properties of single-atom tips, noble electron sources terminated with a single atom. The repairing function of the sources, which had been already demonstrated by using field ion microscope [Fu, et al. Phys. Rev. B 64, 113401 (2001)], was confirmed by using field emission microscopy, and in addition, the demountable character was demonstrated repeatedly. The brightness of the collimated beam emitted from the single-atom tips was estimated to be an order of 1010 A/cm2/str. (E ∼ 2 keV), which is two orders of magnitude higher than those of the conventional field emission sources. There appeared an extra shoulder in the energy spectra, which is strongly correlated with a single-atom ended structure. The fluctuation of the emission current exhibited step- and spike-like noises, which were typical features of nano-electron sources. The single-atom sources are promising candidates of the electron sources in high-performance electron-beam instruments. [DOI: 10.1380/ejssnt.2005.412]
Journal
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- e-Journal of Surface Science and Nanotechnology
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e-Journal of Surface Science and Nanotechnology 3 412-416, 2005
The Japan Society of Vacuum and Surface Science
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Details 詳細情報について
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- CRID
- 1390001205185539584
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- NII Article ID
- 130004438968
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- ISSN
- 13480391
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- Text Lang
- en
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- Data Source
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- JaLC
- Crossref
- CiNii Articles
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- Abstract License Flag
- Disallowed