Application of Self-Organising Maps(SOM) to Chemical Spectra Analysis

• Tokutaka H.

  Department of Electrical and Electronic Engineering, Tottori University

• Obu-Cann K.

  Department of Electrical and Electronic Engineering, Tottori University

• Fujimura K.

  Department of Electrical and Electronic Engineering, Tottori University

• Yoshihara K.

  National Institute for Materials Sciences

• Metal Materials Group of SASJ

抄録

This paper reports on the application of SOM to chemical spectra analysis. The Self-Organising Map (SOM) method that was developed by T. Kohonen [1] was first applied to information processing. Currently, it has been applied to some problems of chemical spectra analysis using AES (Auger Electron Spectroscopy), XPS (X-ray Photoelectron Spectroscopy), and XRD (X-ray Diffraction) data. Using a 2-dimensional SOM, it became clear that the items that are described qualitatively by linguistic expressions could be explained more quantitatively by the position of the spectral data on the SOM together with a grey level expression. Also, the composition of an unknown sample can be determined very precisely by the SOM that has been constructed using the spectra from samples of known composition. Furthermore, this paper addresses the attempts to develop a SOM of all the elements of the periodic table. Currently, only 77 elements have been mapped out.

収録刊行物

• Journal of Surface Analysis

  Journal of Surface Analysis 9 (3), 315-321, 2002

  一般社団法人　表面分析研究会

詳細情報

• CRID: 1390001204473344256
• NII論文ID: 130004439343
• NII論文ID: 40005559383
• NII書誌ID: AA11448771
• DOI: 10.1384/jsa.9.315
• COI: 1:CAS:528:DC%2BD3sXmtlyg
• ISSN: 13478400
• ISSN: 13411756
• NDL書誌ID: 6372866
• Web Site: https://ndlsearch.ndl.go.jp/books/R000000004-I6372866
• Web Site: http://www.jstage.jst.go.jp/article/jsa/9/3/9_3_315/_pdf
• 本文言語コード: en
• データソース種別:
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  • NDL
  • Crossref
  • CiNii Articles
• 抄録ライセンスフラグ: 使用不可