アモルファスシリコン感光体画像欠陥の抑制（1）:—コーン状構造物の構造解析— [in Japanese] The Control of Image Defects in Amorphous Silicon Photoreceptors (1):—The Analysis of Cone-like Structure— [in Japanese]
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The cone-like structure causing image defects in amorphous silicon photoreceptor is analyzed by the Raman scattering, infrared absorption, SIMS and electron spin resonance. The almost of all cone-like structures grow up around the substrate and these are amorphous states. The SiHz and (SiH<sub>2</sub>)<sub><i>n</i></sub> are contained in the cones and the total hydrogen content is about 20 % and the ESR spin density is about 40 % larger than those in the plane surface. The principal features of cone-like structure can be characterized by the existence of large amount of dihydride bonding.
- DENSHI SHASHIN GAKKAISHI (Electrophotography)
DENSHI SHASHIN GAKKAISHI (Electrophotography) 27(3), 395-401, 1988
The Imaging Society of Japan