<i>In</i>-<i>situ</i> Observation of 2-Dimensional X-ray Diffraction of Organic Thin-film Growth by Synchrotron Radiation

• YOSHIMOTO Noriyuki

  Iwate University

• WATANABE Takeshi

  Iwate University

• KOGANEZAWA Tomoyuki

  Japan Synchrotron Radiation Research Institute

• KIKUCHI Mamoru

  Iwate University

• HIROSAWA Ichiro

  Japan Synchrotron Radiation Research Institute

Bibliographic Information

Other Title

• 放射光を用いた有機薄膜成長の2次元X線回折その場観察
• ホウシャコウ オ モチイタ ユウキ ハクマク セイチョウ ノ 2ジゲン Xセン カイセツ ソノ バ カンサツ
• In-situ Observation of 2-Dimensional X-ray Diffraction of Organic Thin-film Growth by Synchrotron Radiation

Abstract

Two-dimensional grazing incidence X-ray diffraction (2D-GIXD) is one of the powerful methods to analyze crystal growth and structure of organic thin films. In this report, we show some experimental examples of 2D-GIXD measurements on organic semiconductor thin-films performed at SPring-8. First, polymorphic transformation of pentacene depending on film thickness observed by means of in-situ real-time 2D-GIXD is shown. Secondly, real-time observation of change in structure during thin-film growth of oligothiophenes by means of 2D-GIXD is shown. Finally, a result of crystal structure analysis from 2D-GIXD data of polycrystalline an oligothiophene thin film is reported.

Journal

• Hyomen Kagaku

  Hyomen Kagaku 35 (4), 190-195, 2014

  The Surface Science Society of Japan

Keywords

• X-ray diffraction
• organic thin film
• crystal growth
• <i>in</i>-<i>situ</i> real-time measurement
• 2D-GIXD

Details

• CRID: 1390282681435305984
• NII Article ID: 130004486888
• NII Article ID: 40020037794
• NII Book ID: AN00334149
• DOI: 10.1380/jsssj.35.190
• ISSN: 18814743
• ISSN: 03885321
• NDL BIB ID: 025391982
• Web Site: https://ndlsearch.ndl.go.jp/books/R000000004-I025391982
• Text Lang: ja
• Data Source:
  • JaLC
  • NDL
  • Crossref
  • CiNii Articles
  • KAKEN
• Abstract License Flag: Disallowed