Contrast of Atomic-Resolution Images from a Noncontact Ultrahigh-Vacuum Atomic Force Microscope.

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  • Ohta Masahiro
    Department of Physics, Faculty of Science, Hiroshima University, 1–3–1 Kagamiyama, Higashi–Hiroshima, Hiroshima 739, Japan
  • Ueyama Hitoshi
    Department of Physics, Faculty of Science, Hiroshima University, 1–3–1 Kagamiyama, Higashi–Hiroshima, Hiroshima 739, Japan
  • Sugawara Yasuhiro
    Department of Physics, Faculty of Science, Hiroshima University, 1–3–1 Kagamiyama, Higashi–Hiroshima, Hiroshima 739, Japan
  • Morita Seizo
    Laboratories of Crystal Physics, Faculty of Science, Hiroshima University, 1–3–1 Kagamiyama, Higashi–Hiroshima, Hiroshima 739, Japan

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Contrast variations of atomic-resolution images were investigated on an InP(110) surface using an ultrahigh-vacuum atomic force microscope (UHV-AFM) in the noncontact mode. The contrast of the atomic-scale AFM image suddenly changed during scanning, which seems to be due to the positional change of the atoms on the tip apex. We observed atomic-scale point defects. These phenomena seem to occur only in monoatomic tip-sample interaction. We also observed an atomic-scale dark area which seems to be due to the convolution of the atomically flat tip and point defects.

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