The Power Durability of 900 MHz Band Double-Mode-Type Surface Acoustic Wave Filters and Improvement in Power Durability of Al-Cu Thin Film Electrodes by Cu Atom Segregation.

Access this Article

Author(s)

    • Kimura Noritoshi
    • Advanced Products Development Center, TDK Corporation, 2–15–7 Higashi–ohwada, Ichikawa, Chiba 272, Japan
    • Nakano Masahiro
    • Advanced Products Development Center, TDK Corporation, 2–15–7 Higashi–ohwada, Ichikawa, Chiba 272, Japan
    • Nakazawa Michiyuki
    • Advanced Products Development Center, TDK Corporation, 2–15–7 Higashi–ohwada, Ichikawa, Chiba 272, Japan
    • Sato Katsuo
    • Advanced Products Development Center, TDK Corporation, 2–15–7 Higashi–ohwada, Ichikawa, Chiba 272, Japan

Abstract

The power durability of double-mode-type surface acoustic wave filters, which have recently seen wide use in cellular phones, is investigated. It was found that the lifetime of double-mode-type surface acoustic wave filters is reduced considerably when high input power is applied, due to non-linear behavior. Moreover, the authors demonstrate that the power durability of an Al-Cu thin film electrode is greatly improved by Cu atom segregation in the grain boundaries.

Journal

  • Japanese Journal of Applied Physics

    Japanese Journal of Applied Physics 36(5B), 3101-3106, 1997

    The Japan Society of Applied Physics

Codes

  • NII Article ID (NAID)
    130004523817
  • Text Lang
    ENG
  • ISSN
    0021-4922
  • Data Source
    J-STAGE 
Page Top