The Power Durability of 900 MHz Band Double-Mode-Type Surface Acoustic Wave Filters and Improvement in Power Durability of Al-Cu Thin Film Electrodes by Cu Atom Segregation.

  • Kimura Noritoshi
    Advanced Products Development Center, TDK Corporation, 2–15–7 Higashi–ohwada, Ichikawa, Chiba 272, Japan
  • Nakano Masahiro
    Advanced Products Development Center, TDK Corporation, 2–15–7 Higashi–ohwada, Ichikawa, Chiba 272, Japan
  • Nakazawa Michiyuki
    Advanced Products Development Center, TDK Corporation, 2–15–7 Higashi–ohwada, Ichikawa, Chiba 272, Japan
  • Sato Katsuo
    Advanced Products Development Center, TDK Corporation, 2–15–7 Higashi–ohwada, Ichikawa, Chiba 272, Japan

書誌事項

タイトル別名
  • Power Durability of 900MHz Band Double-

この論文をさがす

抄録

The power durability of double-mode-type surface acoustic wave filters, which have recently seen wide use in cellular phones, is investigated. It was found that the lifetime of double-mode-type surface acoustic wave filters is reduced considerably when high input power is applied, due to non-linear behavior. Moreover, the authors demonstrate that the power durability of an Al-Cu thin film electrode is greatly improved by Cu atom segregation in the grain boundaries.

収録刊行物

被引用文献 (8)*注記

もっと見る

参考文献 (20)*注記

もっと見る

詳細情報 詳細情報について

問題の指摘

ページトップへ