The Power Durability of 900 MHz Band Double-Mode-Type Surface Acoustic Wave Filters and Improvement in Power Durability of Al-Cu Thin Film Electrodes by Cu Atom Segregation.
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- Kimura Noritoshi
- Advanced Products Development Center, TDK Corporation, 2–15–7 Higashi–ohwada, Ichikawa, Chiba 272, Japan
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- Nakano Masahiro
- Advanced Products Development Center, TDK Corporation, 2–15–7 Higashi–ohwada, Ichikawa, Chiba 272, Japan
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- Nakazawa Michiyuki
- Advanced Products Development Center, TDK Corporation, 2–15–7 Higashi–ohwada, Ichikawa, Chiba 272, Japan
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- Sato Katsuo
- Advanced Products Development Center, TDK Corporation, 2–15–7 Higashi–ohwada, Ichikawa, Chiba 272, Japan
書誌事項
- タイトル別名
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- Power Durability of 900MHz Band Double-
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The power durability of double-mode-type surface acoustic wave filters, which have recently seen wide use in cellular phones, is investigated. It was found that the lifetime of double-mode-type surface acoustic wave filters is reduced considerably when high input power is applied, due to non-linear behavior. Moreover, the authors demonstrate that the power durability of an Al-Cu thin film electrode is greatly improved by Cu atom segregation in the grain boundaries.
収録刊行物
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- Japanese Journal of Applied Physics
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Japanese Journal of Applied Physics 36 (5B), 3101-3106, 1997
The Japan Society of Applied Physics
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詳細情報 詳細情報について
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- CRID
- 1390001206250669952
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- NII論文ID
- 110003946991
- 30021827995
- 130004523817
- 210000041147
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- NII書誌ID
- AA10457675
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- ISSN
- 13474065
- 00214922
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- NDL書誌ID
- 4239985
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- 本文言語コード
- en
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- データソース種別
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- JaLC
- NDL
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- 抄録ライセンスフラグ
- 使用不可