Optical Near-Field Imaging Using the Kelvin Probe Technique.
-
- Abe Masayuki
- Department of Electronic Engineering, Osaka University, 2–1 Yamada–oka, Suita, Osaka 565–0871, Japan
-
- Sugawara Yasuhiro
- Department of Electronic Engineering, Osaka University, 2–1 Yamada–oka, Suita, Osaka 565–0871, Japan
-
- Sawada Kazuyoshi
- Department of Electronic Engineering, Osaka University, 2–1 Yamada–oka, Suita, Osaka 565–0871, Japan
-
- Andoh Yoshitake
- Department of Electronic Engineering, Osaka University, 2–1 Yamada–oka, Suita, Osaka 565–0871, Japan
-
- Morita Seizo
- Department of Electronic Engineering, Osaka University, 2–1 Yamada–oka, Suita, Osaka 565–0871, Japan
書誌事項
- タイトル別名
-
- Optical Near-Field Imaging Using the Ke
この論文をさがす
抄録
In the force detection of the evanescent field using a semiconductor tip, the force gradient is affected not only by the surface potential change due to the evanescent field, but also by the contact potential difference (CPD) between the tip and the sample which is not uniform on the surface. In this paper, we propose a novel method to measure the evanescent field without the CPD effect using the Kelvin probe technique. Simultaneous images of the topography, the CPD and the force gradient due to the evanescent field were obtained on a 15-nm thickness sputtered Au surface. These images showed no correlation in several areas. The lateral resolution of the force gradient due to the evanescent field was better than 15 nm (λ/33).
収録刊行物
-
- Japanese Journal of Applied Physics
-
Japanese Journal of Applied Physics 37 (9A/B), L1074-L1077, 1998
The Japan Society of Applied Physics
- Tweet
キーワード
詳細情報 詳細情報について
-
- CRID
- 1390001206249484032
-
- NII論文ID
- 110003927689
- 130004525319
- 210000044237
-
- NII書誌ID
- AA10650595
-
- ISSN
- 13474065
- 00214922
-
- NDL書誌ID
- 4573172
-
- 本文言語コード
- en
-
- データソース種別
-
- JaLC
- NDL
- Crossref
- CiNii Articles
-
- 抄録ライセンスフラグ
- 使用不可