Effects of Energetic Electron and Proton Irradiation on Electron Emission Yield of Polyimide Induced by Electron and Photon
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- WU Jiang
- Kyushu Institute of Technology State Key Lab of Electrical Insulation and Power Equipment, Xi'an Jiaotong University
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- MIYAHARA Akira
- Kyushu Institute of Technology
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- KHAN Arifur
- Kyushu Institute of Technology
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- IWATA Minoru
- Kyushu Institute of Technology
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- TOYODA Kazuhiro
- Kyushu Institute of Technology
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- CHO Mengu
- Kyushu Institute of Technology
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- ZHENG Xiaoquan
- State Key Lab of Electrical Insulation and Power Equipment, Xi'an Jiaotong University
抄録
As the electron emission yield induced by electron and photon plays a key role in surface potential of spacecraft materials, the ground based degradations including 500 keV electron and 50 keV proton irradiation with 4 different fluences were conducted for the polyimide film separately. Based on the developed measuring systems, the comparative measurements of total electron emission yield and photoelectron emission yield were carried out for the virgin and degraded polyimide samples respectively. The total electron emission yield and photoelectron emission yield tended to have different variation tendency after high energy electron and proton irradiation. The Monte-Carlo analysis software Casino and SRIM were used to analysis the distribution and stopping power of electron and proton respectively. According to the measurement results and analysis, the free radicals caused by irradiation was considered to be the main effect for polyimide films, which can primarily reveal the degradation mechanism of energetic electron and proton on the emission yield of polyimide.
収録刊行物
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- TRANSACTIONS OF THE JAPAN SOCIETY FOR AERONAUTICAL AND SPACE SCIENCES, AEROSPACE TECHNOLOGY JAPAN
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TRANSACTIONS OF THE JAPAN SOCIETY FOR AERONAUTICAL AND SPACE SCIENCES, AEROSPACE TECHNOLOGY JAPAN 12 (ists29), Pr_13-Pr_19, 2014
一般社団法人 日本航空宇宙学会
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詳細情報 詳細情報について
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- CRID
- 1390001205321379328
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- NII論文ID
- 130004548652
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- ISSN
- 18840485
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- 本文言語コード
- en
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- データソース種別
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- JaLC
- Crossref
- CiNii Articles
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- 抄録ライセンスフラグ
- 使用不可