Development of a New Scanning Ion Microbeam Analysis and Imaging Technique: Ion-Luminescence Microscopic Imaging and Spectroscopy (ILUMIS)

• Kada Wataru

  Gunma University

• Satoh Takahiro

  Japan Atomic Energy Agency

• Yokoyama Akihito

  Japan Atomic Energy Agency

• Koka Masashi

  Japan Atomic Energy Agency

• Kamiya Tomihiro

  Japan Atomic Energy Agency

抄録

A new microscopic imaging technique using a MeV ion microbeam probe was demonstrated for the nondestructive imaging and spectroscopy analysis of micrometer-sized targets. Visible luminescence caused from the impact of MeV ion irradiation was analyzed using a newly developed Ion-Luminescence (IL) Microscopic Imaging and Spectroscopy (ILUMIS) system based on a microbeam line of a 3 MV single-ended accelerator. Wavelength-dispersive images of IL were obtained from particulate targets with a spatial resolution of 1 μm and a wavelength resolution of 2 nm. Particular chemical state inside the target was successfully obtained through the spectroscopy of IL analysis.

収録刊行物

• Transactions of the Materials Research Society of Japan

  Transactions of the Materials Research Society of Japan 38 (3), 443-446, 2013

  一般社団法人 日本MRS

キーワード

• Ion luminescence
• microbeam
• microscopic imaging
• chemical state

詳細情報

• CRID: 1390001205512169216
• NII論文ID: 130004676463
• DOI: 10.14723/tmrsj.38.443
• COI: 1:CAS:528:DC%2BC3sXhvVyjtLjF
• ISSN: 21881650
• ISSN: 13823469
• Web Site: https://www.jstage.jst.go.jp/article/tmrsj/38/3/38_443/_pdf
• 本文言語コード: en
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