Dating of active fault gouge using optical stimulated luminescence and thermoluminescence

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  • 光ルミネッセンスと熱ルミネッセンスを利用した活断層破砕帯の年代測定法
  • ヒカリ ルミネッセンス ト ネツ ルミネッセンス オ リヨウ シタ カツダンソウ ハサイタイ ノ ネンダイ ソクテイホウ

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Abstract

This study reports the first optically stimulated luminescence (OSL) dating of an active fault. The examined fault is the Atotsugawa Fault which was triggered the Hietsu earthquake in AD 1858. Ultraviolet thermoluminescence (UV-TL) was also used for an evaluation of an annealing condition of the fault movement. The OSL dating was conducted using quartz grains separated from a fault gouge. An annealing experiment of quartz grains showed that OSL fast component and 270°C UV-TL signals were removed by a temperature of 300°C held for 20 and 12-30 seconds, respectively. These results provide useful information to investigate the temperatures generated during fault activity. The quartz grains analyzed using linear modulated OSL were divided into two types, F and dim-F, with respect to the OSL fast component. The F type emitting the fast component intensely was used for OSL dating as it showed a stable ratio in the dose recovery test. The average OSL age derived from 80 aliquots (each containing about 10 grains) showed an age range of 0.2 ± 0.2 ka. The OSL age agrees well with the age of the Hietsu earthquake of AD 1858 within a range of one standard deviation.

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