Electronic Structure of Ordered Ga0.5In0.5P/GaAs Heterointerface Studied by Raman-Scattering and Photoluminescence-Excitation Measurements
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- Yamashita Kenichi
- Department of Electronics and Information Science, Kyoto Institute of Technology
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- Oe Kunishige
- Department of Electronics and Information Science, Kyoto Institute of Technology
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- Kita Takashi
- Department of Electrical and Electronics Engineering, Faculty of Engineering, Kobe University
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- Wada Osamu
- Department of Electrical and Electronics Engineering, Faculty of Engineering, Kobe University
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- Wang Yong
- Department of Physics, Graduate School of Science, Osaka University
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- Geng Christian
- Physikalisches Institut, Universität Stuttgart
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- Scholz Ferdinand
- Physikalisches Institut, Universität Stuttgart
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- Schweizer Heinz
- Physikalisches Institut, Universität Stuttgart
Bibliographic Information
- Other Title
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- Electronic Structure of Ordered Ga<sub>0.5</sub>In<sub>0.5</sub>P/GaAs Heterointerface Studied by Raman-Scattering and Photoluminescence-Excitation Measurements
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Abstract
We have investigated the electronic band structure of a long-range-ordered Ga0.5In0.5P/GaAs heterointerface by optical measurements and a semi-empirical calculation. Raman-scattering spectra of the ordered Ga0.5In0.5P/GaAs samples show plasmon–phonon coupled modes induced by dense electron accumulation at the heterointerface, in contrast to that of the unordered sample which shows the spectrum of bulk GaAs. Furthermore, the Franz–Keldysh oscillation observed in the photoluminescence-excitation spectrum indicates a strong interface electric field. According to the results of a comparison between the experiment and a semi-empirical calculation based on Poisson’s law, it is found that the spatial distribution of the accumulated electron density is modified strongly by the conduction-band discontinuity and the interface field, depending on the order parameter.
Journal
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- Japanese Journal of Applied Physics
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Japanese Journal of Applied Physics 44 (10), 7390-7394, 2005
The Japan Society of Applied Physics
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Details 詳細情報について
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- CRID
- 1390282681243356288
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- NII Article ID
- 130004766012
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- NII Book ID
- AA10457675
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- ISSN
- 13474065
- 00214922
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- NDL BIB ID
- 7478591
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- Text Lang
- en
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- Data Source
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- JaLC
- NDL
- Crossref
- CiNii Articles
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- Abstract License Flag
- Disallowed