<i>In Situ</i> Observation of Magnetic Anisotropy Energy of Alternately Layered FeNi Thin Films

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Author(s)

    • Sakamaki Masako
    • Photon Factory and Condensed Matter Research Center, Institute of Materials Structure Science, High Energy Accelerator Research Organization, Japan
    • Amemiya Kenta
    • Photon Factory and Condensed Matter Research Center, Institute of Materials Structure Science, High Energy Accelerator Research Organization, Japan

Abstract

Magnetic anisotropy of alternately layered FeNi thin films grown on Ni(3--21 ML)/Cu(001) is investigated by means of the X-ray magnetic circular dichroism (XMCD). Perpendicular magnetic anisotropy is observed when the substrate Ni is thicker than 15 and 20 ML for 4 and 6 ML FeNi films, respectively, while in-plane magnetic anisotropy appears at the thinner substrate Ni region. By comparing with the magnetic phase diagram calculated from the magnetic anisotropy energies, which are obtained by the XMCD study [M. Sakamaki and K. Amemiya, Appl. Phys. Express 4, 073002 (2011)], we show that the phase boundary of the present samples shifts so as to prefer the in-plane magnetic anisotropy. This might be caused by the structural relaxation in the substrate Ni. [DOI: 10.1380/ejssnt.2012.97]

Journal

  • e-Journal of Surface Science and Nanotechnology

    e-Journal of Surface Science and Nanotechnology 10(0), 97-99, 2012

    The Surface Science Society of Japan

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