Surface electrical conductivity measurement system with micro-four-point probes at sub-Kelvin temperature under high magnetic field in ultrahigh vacuum, e-J
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- Yamada Manabu
- Department of Physics, Graduate School of Science, University of Tokyo, Japan
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- Hirahara Toru
- Department of Physics, Graduate School of Science, University of Tokyo, Japan
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- Hobara Rei
- Department of Physics, Graduate School of Science, University of Tokyo, Japan
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- Hasegawa Shuji
- Department of Physics, Graduate School of Science, University of Tokyo, Japan
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- Mizuno Hiroyuki
- UNISOKU Co., Ltd., Japan
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- Miyatake Yutaka
- UNISOKU Co., Ltd., Japan
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- Nagamura Toshihiko
- UNISOKU Co., Ltd., Japan
書誌事項
- タイトル別名
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- Surface Electrical Conductivity Measurement System with Micro-Four-Point Probes at Sub-Kelvin Temperature under High Magnetic Field in Ultrahigh Vacuum
抄録
We have constructed an ultrahigh vacuum system in which surface conductivity is measured in situ by micro-four-point probe method down to 0.8 K, combined with conventional surface preparation/analysis capability. In order to reduce the data scattering due to changes of the probe spacing, we have employed a dual configuration method in which the combinations with current/voltage probes are switched. The surface-state superconductivity of Si(111)-√7 × √3-In surface superstructure was confirmed with the critical temperature of 2.8 K. The critical magnetic field was 0.3-0.4 T in the surface-normal direction. [DOI: 10.1380/ejssnt.2012.400]
収録刊行物
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- e-Journal of Surface Science and Nanotechnology
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e-Journal of Surface Science and Nanotechnology 10 (0), 400-405, 2012
公益社団法人 日本表面真空学会
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詳細情報 詳細情報について
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- CRID
- 1390001205186817408
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- NII論文ID
- 130004933751
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- ISSN
- 13480391
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- 本文言語コード
- en
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- データソース種別
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- JaLC
- Crossref
- CiNii Articles
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- 抄録ライセンスフラグ
- 使用不可
