Surface Potential Investigation of Fullerene Derivative Film on Platinum Electrode under UV Irradiation by Kelvin Probe Force Microscopy Using a Piezoelectric Cantilever

• Satoh Nobuo

  Department of Electronic Science and Engineering, Kyoto University

• Katori Shigetaka

  Department of Electronic Science and Engineering, Kyoto University

• Kobayashi Kei

  The Hakubi Center for Advanced Research, Kyoto University

• Watanabe Shunji

  Nikon Corporation

• Fujii Toru

  Nikon Corporation

• Matsushige Kazumi

  Department of Electronic Science and Engineering, Kyoto University

• Yamada Hirofumi

  Department of Electronic Science and Engineering, Kyoto University

抄録

Dynamic-mode atomic force microscopy (DFM) combined with Kelvin probe force microscopy (KFM) has been a powerful tool not only for imaging surface topography but also for investigating surface potential on a nanometer-scale resolution. We have developed DFM/KFM using a microfabricated cantilever with a lead zirconate titanate (PZT) piezoelectric thin film used as a deflection sensor. The observed sample can be in a completely dark environment because no optics are required for cantilever deflection sensing in our experimental setup, which is also equipped with a mechanism to irradiate ultraviolet (UV) light onto the sample. We prepared a platinum-on-silicon substrate and deposited fullerene-derivative (PCBM; [6,6]-Phenyl-C₆₁-Butyric Acid Methyl Ester) film patterns by vacuum evaporation with two shadow masks in crossed directions. The energy band diagram with band-bending, it was created by simultaneously obtaining topographic and surface potential images of the same area using the developed DFM/KFM. [DOI: 10.1380/ejssnt.2015.102]

収録刊行物

• e-Journal of Surface Science and Nanotechnology

  e-Journal of Surface Science and Nanotechnology 13 (0), 102-106, 2015

  公益社団法人 日本表面真空学会

キーワード

• Dynamic-mode atomic force microscopy (DFM)
• Kelvin probe force microscopy (KFM)
• Piezoelectric cantilever

詳細情報

• CRID: 1390282680162948224
• NII論文ID: 130004933845
• DOI: 10.1380/ejssnt.2015.102
• ISSN: 13480391
• 本文言語コード: en
• データソース種別:
  • JaLC
  • Crossref
  • CiNii Articles
  • KAKEN
• 抄録ライセンスフラグ: 使用不可