Time-resolved Bragg coherent X-ray diffraction revealing ultrafast lattice dynamics in nano-thickness crystal layer using X-ray free electron laser

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Abstract

Ultrafast time-resolved Bragg coherent X-ray diffraction (CXD) has been performed to investigate lattice dynamics in a thin crystal layer with a nanoscale thickness by using a SASE (Self-Amplified Spontaneous Emission)–XFEL (X-ray Free Electron Laser) facility, SACLA. Single-shot Bragg coherent diffraction patterns of a 100 nm-thick silicon crystal were measured in the asymmetric configuration with a grazing exit using an area detector. The measured coherent diffraction patterns showed fringes extending in the surface normal direction. By using an optical femtosecond laser-pump and the XFEL-probe, a transient broadening of coherent diffraction pattern profile was observed at a delay time of around a few tens of picosecond, indicating transient crystal lattice fluctuation induced by the optical laser. A perspective application of the time-resolved Bragg CXD method to investigate small sized grains composing ceramic materials is discussed.

Journal

  • Journal of the Ceramic Society of Japan

    Journal of the Ceramic Society of Japan 121(1411), 283-286, 2013

    The Ceramic Society of Japan

Codes

  • NII Article ID (NAID)
    130004950827
  • NII NACSIS-CAT ID (NCID)
    AA12229489
  • Text Lang
    ENG
  • Article Type
    journal article
  • ISSN
    1882-0743
  • NDL Article ID
    024291071
  • NDL Call No.
    Z78-A504
  • Data Source
    NDL  IR  J-STAGE 
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