Time-resolved Bragg coherent X-ray diffraction revealing ultrafast lattice dynamics in nano-thickness crystal layer using X-ray free electron laser

• TANAKA Yoshihito

  RIKEN/SPring-8 Center Department of Physics, School of Science and Technology, Kwansei Gakuin University

• ITO Kiminori

  RIKEN/SPring-8 Center

• NAKATANI Takashi

  RIKEN/SPring-8 Center Department of Physics, School of Science and Technology, Kwansei Gakuin University

• ONITSUKA Rena

  RIKEN/SPring-8 Center Department of Physics, School of Science and Technology, Kwansei Gakuin University

• NEWTON Marcus

  Research Institute for Electronic Science, Hokkaido University

• SATO Takahiro

  RIKEN/SPring-8 Center

• TOGASHI Tadashi

  Japan Synchrotron Radiation Research Institute

• YABASHI Makina

  RIKEN/SPring-8 Center

• KAWAGUCHI Tomoya

  Department of Materials Science and Engineering, Kyoto University

• SHIMADA Koki

  Department of Materials Science and Engineering, Kyoto University

• TOKUDA Kazuya

  Department of Materials Science and Engineering, Kyoto University

• TAKAHASHI Isao

  Department of Physics, School of Science and Technology, Kwansei Gakuin University

• ICHITSUBO Tetsu

  Department of Materials Science and Engineering, Kyoto University

• MATSUBARA Eiichiro

  Department of Materials Science and Engineering, Kyoto University

• NISHINO Yoshinori

  RIKEN/SPring-8 Center Research Institute for Electronic Science, Hokkaido University

抄録

Ultrafast time-resolved Bragg coherent X-ray diffraction (CXD) has been performed to investigate lattice dynamics in a thin crystal layer with a nanoscale thickness by using a SASE (Self-Amplified Spontaneous Emission)–XFEL (X-ray Free Electron Laser) facility, SACLA. Single-shot Bragg coherent diffraction patterns of a 100 nm-thick silicon crystal were measured in the asymmetric configuration with a grazing exit using an area detector. The measured coherent diffraction patterns showed fringes extending in the surface normal direction. By using an optical femtosecond laser-pump and the XFEL-probe, a transient broadening of coherent diffraction pattern profile was observed at a delay time of around a few tens of picosecond, indicating transient crystal lattice fluctuation induced by the optical laser. A perspective application of the time-resolved Bragg CXD method to investigate small sized grains composing ceramic materials is discussed.

収録刊行物

• Journal of the Ceramic Society of Japan

  Journal of the Ceramic Society of Japan 121 (1411), 283-286, 2013

  公益社団法人 日本セラミックス協会

キーワード

• Coherent X-ray diffraction
• Time-resolved measurement
• X-ray free electron laser
• Semiconductor
• Nanocrystal

詳細情報

• CRID: 1390282680263614208
• NII論文ID: 130004950827
• NII書誌ID: AA12229489
• DOI: 10.2109/jcersj2.121.283
• ISSN: 13486535
• ISSN: 18820743
• HANDLE: 2115/52780
• NDL書誌ID: 024291071
• Web Site: https://ndlsearch.ndl.go.jp/books/R000000004-I024291071
• Web Site: https://www.jstage.jst.go.jp/article/jcersj2/121/1411/121_JCSJ-P12210/_pdf
• 本文言語コード: en
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