Probing of Electric Field Distribution and Carrier Behavior in Double-Layer Organic Light-Emitting Diodes by a Novel Microscopic Electric-Field-Induced Optical Second-Harmonic Generation Measurement system

• Sadakata Atsuo

  Department of Physical Electronics, Tokyo Institute of Technology

• Yano Ryota

  Department of Physical Electronics, Tokyo Institute of Technology

• Taguchi Dai

  Department of Physical Electronics, Tokyo Institute of Technology

• Manaka Takaaki

  Department of Physical Electronics, Tokyo Institute of Technology

• Iwamoto Mitsumasa

  Department of Physical Electronics, Tokyo Institute of Technology

抄録

To analyze carrier behaviors leading to electroluminescence (EL) of double-layer organic light-emitting diodes (OLEDs), we used a novel microscopic electric-field-induced optical second-harmonic generation measurement system equipped with a radially polarized pulsed laser beam, which can probe two-dimensional electric field distributions in OLEDs. We showed a relationship between EL emission distribution and interfacial accumulated charge distribution.

収録刊行物

• Transactions of the Materials Research Society of Japan

  Transactions of the Materials Research Society of Japan 39 (4), 443-446, 2014

  一般社団法人 日本MRS

キーワード

• organic light-emitting diodes
• an electric field distribution
• the distribution of interfacial accumulation charge
• microscopic electric-field-induced optical second-harmonic generation measurement

詳細情報

• CRID: 1390282680488826112
• NII論文ID: 130005004377
• DOI: 10.14723/tmrsj.39.443
• ISSN: 21881650
• ISSN: 13823469
• 本文言語コード: ja
• データソース種別:
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• 抄録ライセンスフラグ: 使用不可