Study on Variable Rotation Polishing in CMP Process (1st report)

DOI

書誌事項

タイトル別名
  • Investigation of the Variable Rotation Polishing Efficiency

抄録

In this study, a novel Variable Rotation Polishing method would be proposed in order to increase the unsteady slurry flow in CMP process for increasing the polishing efficiency and for flowing slurry into the center of wafer sufficiently when the wafer becomes larger and also in case of saving the slurry. We developed a control unit to control platen variable rotation speed and rotation direction and rotation angle. This paper investigates the efficiency of variable rotation in CMP process. Consequently, material removals of all conditions in case of Variable Rotation Polishing were higher than only forward rotation.

収録刊行物

詳細情報 詳細情報について

  • CRID
    1390001205655873536
  • NII論文ID
    130005031918
  • DOI
    10.11522/pscjspe.2013s.0.649.0
  • 本文言語コード
    en
  • データソース種別
    • JaLC
    • CiNii Articles
  • 抄録ライセンスフラグ
    使用不可

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