Observation of Fe/BaTiO₃Interface State by X-Ray Absorption Spectroscopy

• Sakamaki Masako

  Institute of Materials Structure Science, High Energy Accelerator Research Organization Department of Materials Structure Science, School of High Energy Accelerator Science, The Graduate University for Advanced Studies (SOKENDAI)

• Amemiya Kenta

  Institute of Materials Structure Science, High Energy Accelerator Research Organization Department of Materials Structure Science, School of High Energy Accelerator Science, The Graduate University for Advanced Studies (SOKENDAI)

Abstract

Electric field-induced change of magnetic properties in ferromagnetic Fe thin film grown on a ferroelectric BaTiO₃ (BTO) substrate is studied by means of x-ray absorption spectroscopy. We find that a few nm Fe oxide layer exists at the Fe/BTO interface when the Fe thickness is 8 nm, in which the film shows in-plane magnetization. The x-ray magnetic circular dichroism analysis reveals that the coercive field, H_c, of Fe shows a hysteresis behavior as a function of the electric field, and larger H_c is observed at ∼ ±3 kV/cm. On the other hand, it is found from the extended x-ray absorption fine structure analysis that the Fe-O bond distance shows a similar electric field dependence to that of H_c, and shorter distance is observed at ∼ ±3 kV/cm. Therefore, it is assumed that the H_c strongly depends on the ferroelectric domain structure of BTO, and larger H_c is observed for the multi-domain structure. We suppose that shrinking of the Fe–O distance caused by the domain formation leads to an enhancement of H_c due to the island-like localization of the interface Fe oxide. [DOI: 10.1380/ejssnt.2015.139]

Journal

• e-Journal of Surface Science and Nanotechnology

  e-Journal of Surface Science and Nanotechnology 13 (0), 139-142, 2015

  The Japan Society of Vacuum and Surface Science

Keywords

• X-ray absorption spectroscopy
• Extended X-ray absorption fine structure (EXAFS)
• Field effect
• Magnetic films
• X-ray magnetic circular dichroism (XMCD)

Details

• CRID: 1390282680161971456
• NII Article ID: 130005063561
• DOI: 10.1380/ejssnt.2015.139
• ISSN: 13480391
• Text Lang: en
• Data Source:
  • JaLC
  • Crossref
  • CiNii Articles
  • KAKEN
• Abstract License Flag: Disallowed