Multispectral Reflection Measuring and Rendering Method for Silk Textiles

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A reflection-model-based method for digital archiving of silk textiles is proposed. Archive data is rendered as three-dimensional (3D) computer graphics (CG) images. In this study, we describe a reflection process on a silk textile using a mathematical model (i.e., the reflection model). The reflection properties of the silk textile are quantified as the reflection model parameters obtained from measured data. To determine the reflection model parameters, we developed two systems for measuring the reflection properties and surface structure of a silk textile. The first system uses a goniometric multiband camera system to measure the spectral reflectance and surface reflection properties of a silk textile. We then estimate various reflection model parameters using the device for measuring the reflection intensity. The second system measures the 3D surface structure of the silk cloth. To estimate complex reflections, such as those from glossy silk, we developed a system to measure the microscopic 3D form of the object's surface. We also developed an estimation method with statistical analysis of multispectral information obtained by a multiband camera to estimate spectral reflectance. We use a photometric stereo-based method to estimate the microscopic 3D structure of a silk cloth. The reflection model parameters employed as the reflection properties are estimated from camera measurements of reflection intensity and the microscopic 3D structure of the target surface obtained at different illumination and viewing angles. We then render a realistic 3D CG image of the silk textile using the reflection model and the estimated data. We confirm the validity of the proposed method visually. The accuracy of the spectral reflectance estimation results is confirmed by comparing the proposed and previous methods. The proposed method with a multiband camera showed higher accuracy compared with previous studies.

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