Millimeter-Wave Ellipsometry Using Interface-Planarization Prism

• YAMAMOTO Hiroshi

  Center for Natural Sciences, Kitasato University

• ITO Hiroshi

  Center for Natural Sciences, Kitasato University Graduate School of Medical Sciences, Kitasato University

Abstract

The use of an interface-planarization (IP) prism in millimeter-wave ellipsometry is proposed to achieve reproducible measurements of soft, protean, and non-flat samples. The complex relative dielectric constants of a slice of bovine tissue were successfully measured at frequencies from 90 to 140 GHz using the IP prism to confirm its applicability. The use of the IP prism was found to be advantageous for protecting the sample surface from the desiccation during the measurements.

Journal

• IEICE Transactions on Electronics

  IEICE Transactions on Electronics E98.C (8), 873-877, 2015

  The Institute of Electronics, Information and Communication Engineers

Keywords

• ellipsometry
• millimeter wave
• UTC-PD
• biological tissue

Details

• CRID: 1390001204377695744
• NII Article ID: 130005090389
• DOI: 10.1587/transele.e98.c.873
• ISSN: 17451353
• ISSN: 09168524
• Web Site: https://www.jstage.jst.go.jp/article/transele/E98.C/8/E98.C_873/_pdf
• Text Lang: en
• Data Source:
  • JaLC
  • Crossref
  • CiNii Articles
• Abstract License Flag: Disallowed