Development of microscopic measurement system for electro-optic effect

• YAMAMOTO Ryuta

  Nano-Phononics Lab., Graduate School of Science and Engineering, Tokyo Institute of Technology

• HOSHINA Takuya

  Nano-Phononics Lab., Graduate School of Science and Engineering, Tokyo Institute of Technology

• TAKEDA Hiroaki

  Nano-Phononics Lab., Graduate School of Science and Engineering, Tokyo Institute of Technology

• TSURUMI Takaaki

  Nano-Phononics Lab., Graduate School of Science and Engineering, Tokyo Institute of Technology

Abstract

This paper reports a microscopic electro-optic (EO) effect measurement system that is based on the Senarmont method and enables measurement of the EO coefficients (Kerr coefficients) of submillimeter-sized crystalline materials. In this study, an estimation of the electric field applied to the crystalline sample was performed with a finite-element method because the parallel plate electrodes were required to be on the same side of the sample surface. Reproducible values of the EO coefficients of submillimeter-sized (Pb,La)(Zr,Ti)O₃ transparent ceramics were obtained only if this estimation was taken into account. This system will effectively increase the speed of searches for new EO materials.

Journal

• Journal of the Ceramic Society of Japan

  Journal of the Ceramic Society of Japan 123 (1441), 929-932, 2015

  The Ceramic Society of Japan

Keywords

• Electro-optic effect
• Optical microscopy
• Kerr effect

Details

• CRID: 1390001205286784768
• NII Article ID: 130005096370
• DOI: 10.2109/jcersj2.123.929
• ISSN: 13486535
• ISSN: 18820743
• Web Site: https://www.jstage.jst.go.jp/article/jcersj2/123/1441/123_JCSJ-T15114/_pdf
• Text Lang: ja
• Data Source:
  • JaLC
  • Crossref
  • CiNii Articles
  • KAKEN
• Abstract License Flag: Disallowed