An Allocation Optimization Method for Partially-reliable Scratch-pad Memory in Embedded Systems

• Hatayama Takuya

  Graduate School of Informatics, Kyoto University

• Takase Hideki

  Graduate School of Informatics, Kyoto University

• Takagi Kazuyoshi

  Graduate School of Informatics, Kyoto University

• Takagi Naofumi

  Graduate School of Informatics, Kyoto University

Abstract

In this paper, we propose the use of a memory system which has a partially reliable scratch-pad memory (SPM). The reliable region of the SPM employing the ECC is higher soft error tolerant but larger energy consumption than the normal region. We propose an allocation method in order to optimize energy consumption while ensuring required reliability. An allocation method about instruction and data to proposed memory system is formulated as integer linear programming, where the solution archives optimal energy consumption and required reliability. Evaluation result shows that the proposed method is effective when overhead for error correction is large.

Journal

• Information and Media Technologies

  Information and Media Technologies 10 (3), 420-424, 2015

  Information and Media Technologies Editorial Board

Keywords

• energy minimization
• reliability
• scratch-pad memory

Details

• CRID: 1390001205264730112
• NII Article ID: 130005100029
• DOI: 10.11185/imt.10.420
• ISSN: 18810896
• Text Lang: en
• Data Source:
  • JaLC
  • CiNii Articles
  • KAKEN
• Abstract License Flag: Disallowed