A Study of Physical Design Guidelines in ThruChip Inductive Coupling Channel

DOI Web Site 被引用文献2件 オープンアクセス
  • HSU Li-Chung
    Department of Electronics and Electrical Engineering, Keio University
  • KADOMOTO Junichiro
    Department of Electronics and Electrical Engineering, Keio University
  • HASEGAWA So
    Department of Electronics and Electrical Engineering, Keio University
  • KOSUGE Atsutake
    Department of Electronics and Electrical Engineering, Keio University
  • TAKE Yasuhiro
    Department of Electronics and Electrical Engineering, Keio University
  • KURODA Tadahiro
    Department of Electronics and Electrical Engineering, Keio University

抄録

ThruChip interface (TCI) is an emerging wireless interface in three-dimensional (3-D) integrated circuit (IC) technology. However, the TCI physical design guidelines remain unclear. In this paper, a ThruChip test chip is designed and fabricated for design guidelines exploration. Three inductive coupling interface physical design scenarios, baseline, power mesh, and dummy metal fill, are deployed in the test chip. In the baseline scenario, the test chip measurement results show that thinning chip or enlarging coil dimension can further reduce TCI power. The power mesh scenario shows that the eddy current on power mesh can dramatically reduce magnetic pulse signal and thus possibly cause TCI to fail. A power mesh splitting method is proposed to effectively suppress eddy current impact while minimizing power mesh structure impact. The simulation results show that the proposed method can recover 77% coupling coefficient loss while only introducing additional 0.5% IR-drop. In dummy metal fill case, dummy metal fill enclosed within TCI coils have no impact on TCI transmission and thus are ignorable.

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