Strain Measurement of Micrometre-Sized Structures under Tensile Loading by Using Scanning White-Light Interferometry

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  • Ito Takashi
    Department of Materials Science and Engineering, Graduate School of Science and Technology, Kumamoto University
  • Mine Yoji
    Department of Materials Science and Engineering, Graduate School of Science and Technology, Kumamoto University
  • Otsu Masaaki
    Department of Mechanical Engineering, Graduate School of Engineering, University of Fukui
  • Takashima Kazuki
    Department of Materials Science and Engineering, Graduate School of Science and Technology, Kumamoto University

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  • 走査型白色干渉計を用いた引張負荷下における微小構造体のひずみ分布測定
  • ソウサガタ ハクショク カンショウケイ オ モチイタ ヒッパリ フカカ ニ オケル ビショウ コウゾウタイ ノ ヒズミ ブンプ ソクテイ

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Abstract

  A scanning white-light interferometry (SWLI) technique was used to image the surface topography and measure the in-plane strain in micrometre-sized structures subjected to uniaxial tensile deformation. This technique was applied to observing the macro and local deformation behaviours in micrometre-sized Au specimens. Reproducible stress-strain curves were successfully obtained using SWLI during the intermittent tensile tests. The local strain distribution was also calculated from the movement of natural gauge marks that are characteristic of triangular elements. Combining this micro-tensile test with orientation imaging microscopy enables crystal plasticity of mesoscale structures to be revealed.<br>

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