Microscopic Observation of Degradation of LaNiO<sub>3 </sub>Ultrathin Films Caused by Air Exposure

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Author(s)

    • Wakabayashi Yusuke
    • Division of Materials Physics, Graduate School of Engineering Science, Osaka University
    • Maeda Hiroki
    • Division of Materials Physics, Graduate School of Engineering Science, Osaka University
    • Kimura Tsuyoshi
    • Division of Materials Physics, Graduate School of Engineering Science, Osaka University
    • Sakata Osami
    • Synchrotron X-ray Station at SPring-8, National Institute for Materials Science (NIMS)

Abstract

Sample degradation of LaNiO<sub>3</sub> ultrathin films on SrTiO<sub>3</sub> (001) substrate caused by air exposure is examined by means of crystal truncation rod (CTR) scattering method. Although the film is conductive right after the sample deposition, long term storage makes it insulating. CTR measurements were performed on three- and four-unit cell-thick samples just after the sample deposition and after six months of storage in air. The results show that the storage induced a signicant increase in the lattice spacing along the surface normal direction with keeping in-plane periodicity. Such a structural change can be caused by escaping oxygen atoms by the thermal uctuation. [DOI: 10.1380/ejssnt.2016.14]

Journal

  • e-Journal of Surface Science and Nanotechnology

    e-Journal of Surface Science and Nanotechnology 14(0), 14-16, 2016

    The Surface Science Society of Japan

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