Microscopic Observation of Degradation of LaNiO₃Ultrathin Films Caused by Air Exposure

• Wakabayashi Yusuke

  Division of Materials Physics, Graduate School of Engineering Science, Osaka University

• Maeda Hiroki

  Division of Materials Physics, Graduate School of Engineering Science, Osaka University

• Kimura Tsuyoshi

  Division of Materials Physics, Graduate School of Engineering Science, Osaka University

• Sakata Osami

  Synchrotron X-ray Station at SPring-8, National Institute for Materials Science (NIMS)

• Sakai Enju

  High energy accelerator research organization

• Kumigashira Hiroshi

  High energy accelerator research organization

Abstract

Sample degradation of LaNiO₃ ultrathin films on SrTiO₃ (001) substrate caused by air exposure is examined by means of crystal truncation rod (CTR) scattering method. Although the film is conductive right after the sample deposition, long term storage makes it insulating. CTR measurements were performed on three- and four-unit cell-thick samples just after the sample deposition and after six months of storage in air. The results show that the storage induced a signicant increase in the lattice spacing along the surface normal direction with keeping in-plane periodicity. Such a structural change can be caused by escaping oxygen atoms by the thermal uctuation. [DOI: 10.1380/ejssnt.2016.14]

Journal

• e-Journal of Surface Science and Nanotechnology

  e-Journal of Surface Science and Nanotechnology 14 (0), 14-16, 2016

  The Japan Society of Vacuum and Surface Science

Keywords

• X-ray scattering, diffraction, and reflection
• Oxidation
• Nickel oxides
• Heterojunctions

Details

• CRID: 1390282680164259840
• NII Article ID: 130005122727
• DOI: 10.1380/ejssnt.2016.14
• ISSN: 13480391
• Web Site: https://www.jstage.jst.go.jp/article/ejssnt/14/0/14_14/_pdf
• Text Lang: en
• Data Source:
  • JaLC
  • Crossref
  • CiNii Articles
  • KAKEN
• Abstract License Flag: Disallowed