Scanning Atom Probe Analysis Alternately Triggered by Voltage and Laser Pulse

• Taniguchi Masahiro

  Department of Applied Chemistry, College of Bioscience and Chemistry, Kanazawa Institute of Technology

• Nishikawa Osamu

  Division of Industry-University Collaboration, Kanazawa Institute of Technology

Abstract

Voltage pulse which has been used from the establishment of atom probe (AP) in the 1960's is going to be replaced by short pulsed laser with high repetition rate in the nanometer scale characterization of materials by 3D-AP. Scanning Atom Probe (SAP) has a miniature electrode for acceptance of non-needle shaped specimens which allows us to analyze non-solid materials which are common in chemistry. The selectivity and the adaptability of voltage pulse and laser pulse are not clear in the non-bulk materials which are common in chemistry but not familiar in AP field. Two types of trigger, voltage pulse and laser pulse, were applied alternately to the identical sample to perform direct comparison. Tungsten tip, conventional material in AP, and amino acid (L-Tryptophan) supported on carbon nanotube were chosen as candidates for this analysis. The dual trigger system successfully worked on metallic sample and the selectivity of the ion species and adaptability were demonstrated on molecular system. [DOI: 10.1380/ejssnt.2016.69]

Journal

• e-Journal of Surface Science and Nanotechnology

  e-Journal of Surface Science and Nanotechnology 14 (0), 69-72, 2016

  The Japan Society of Vacuum and Surface Science

Keywords

• Field ion microscopy
• Field evaporation
• Field ionization
• Scanning atom probe
• Mass spectroscopy
• Tungsten
• Biological molecules

Details

• CRID: 1390282680163995776
• NII Article ID: 130005132816
• DOI: 10.1380/ejssnt.2016.69
• ISSN: 13480391
• Web Site: https://www.jstage.jst.go.jp/article/ejssnt/14/0/14_69/_pdf
• Text Lang: en
• Data Source:
  • JaLC
  • Crossref
  • CiNii Articles
• Abstract License Flag: Disallowed