Surface Micro-XAFS and Its Application to Real-time Observation of Organic Thin Films

• Baba Yuji

  Japan Atomic Energy Agency

• Sekiguchi Tetsuhiro

  Japan Atomic Energy Agency

• Shimoyama Iwao

  Japan Atomic Energy Agency

• Hirao Norie

  Japan Atomic Energy Agency

Abstract

X-ray absorption fine structure (XAFS) is a powerful tool to investigate electronic structures, valence states and molecular orientations at solid surfaces. In order to observe nano-scaled dynamic phenomena at solid surfaces, we have developed a micro-XAFS system using a photoelectron emission microscopy (PEEM) excited by synchrotron radiation in soft X-ray region. Here we explain the performance of our system concentrating on the recent development of quick measurements, and demonstrated that a PEEM image can be taken in a short time down to 10 msec. As an application of the system, we present the results for the real-time mapping of molecular orientations at nanometer scale for organic thin films. We demonstrated that the orientations of organic molecules in a microscopic region change during surface diffusion.

Journal

• Journal of Surface Analysis

  Journal of Surface Analysis 17 (3), 333-336, 2011

  The Surface Analysis Society of Japan

Details

• CRID: 1390001204471338240
• NII Article ID: 130005138968
• NII Book ID: AA11448771
• DOI: 10.1384/jsa.17.333
• ISSN: 13478400
• ISSN: 13411756
• NDL BIB ID: 11077724
• Web Site: https://ndlsearch.ndl.go.jp/books/R000000004-I11077724
• Web Site: https://www.jstage.jst.go.jp/article/jsa/17/3/17_333/_pdf
• Text Lang: en
• Data Source:
  • JaLC
  • NDL
  • Crossref
  • CiNii Articles
• Abstract License Flag: Disallowed