小学校高学年・中学生の批判的思考態度の測定:-認知的熟慮性-衝動性,認知された学習コンピテンス,教育プログラムとの関係-  [in Japanese] Measurement of Critical Thinking Attitude in Fifth- Through Ninth-Graders:Relationship to Reflective Predisposition, Perceived Academic Competence and the Educational Program  [in Japanese]

Access this Article

Search this Article

Author(s)

Abstract

本研究は,児童・生徒用一般的批判的思考態度(CT-G)と学習場面の批判的思考態度(CT-S,各10項目)を用いて,認知的熟慮性-衝動性,認知された学習コンピテンス,教育プログラムとの関係を解明した.小学校5,6年生312人,中学1,2,3年生306人に,4ヶ月間隔をおいた2回の調査を実施した.そのうち,中学1年生125人に対しては,28ヶ月後の3回目調査を実施した.1回目調査において一般的および学習場面の批判的思考態度の2尺度の信頼性を内的整合性によって確認した.さらに,構成概念妥当性を確認的因子分析,基準関連妥当性を関連尺度との相関に基づいて確認した.パス解析の結果,3回の調査いずれにおいても,(i) 熟慮性は,一般的批判的思考態度に影響を及ぼし,(ii) 一般的批判的思考態度は学習場面の批判的思考態度に影響を及ぼした.そして,(iii) 学習場面の批判的思考態度は学習コンピテンスに影響を及ぼした.最後に,教育プログラムの影響について考察した.

We explored the relationships between critical thinking attitude, reflective predisposition, perceived academic competence, and the educational program. A two-wave questionnaire survey with a four-month interval was administered to 312 elementary school students (5th and 6th graders) and 306 junior high school students (7th–9th graders) in Japan using two scales: to measure critical thinking attitude in general (CT-G, a 10-item scale) and in study (CT-S, a 10-item scale) . In addition, 125 students (the same 7th graders) completed the scales 28 months later. Results indicated satisfactory internal consistency reliability and construct validity of both scales. The CT-G and CT-S scales were significantly correlated with the cognitive reflective-impulsive predisposition and perceived academic competence, supporting their criterion-related validity. A simultaneous path analysis revealed that during each wave, (i) reflective predisposition influenced CT-G, (ii) CT-G affected CT-S, and (iii) CT-S affected perceived academic competence. Finally, the effects of educational program are discussed.

Journal

  • Japan Journal of Educational Technology

    Japan Journal of Educational Technology 40(1), 33-44, 2016

    Japan Society for Educational Technology

Codes

  • NII Article ID (NAID)
    130005157909
  • NII NACSIS-CAT ID (NCID)
    AA11964147
  • Text Lang
    JPN
  • Article Type
    journal article
  • ISSN
    1349-8290
  • NDL Article ID
    027507801
  • NDL Call No.
    Z7-904
  • Data Source
    NDL  IR  J-STAGE 
Page Top