Analytical Stability Modeling for CMOS Latches in Low Voltage Operation
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- KAMAKARI Tatsuya
- Department of Communications and Computer Engineering, Kyoto University
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- SHIOMI Jun
- Department of Communications and Computer Engineering, Kyoto University
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- ISHIHARA Tohru
- Department of Communications and Computer Engineering, Kyoto University
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- ONODERA Hidetoshi
- Department of Communications and Computer Engineering, Kyoto University CREST, JST
Abstract
<p>In synchronous LSI circuits, memory subsystems such as Flip-Flops and SRAMs are essential components and latches are the base elements of the common memory logics. In this paper, a stability analysis method for latches operating in a low voltage region is proposed. The butterfly curve of latches is a key for analyzing a retention failure of latches. This paper discusses a modeling method for retention stability and derives an analytical stability model for latches. The minimum supply voltage where the latches can operate with a certain yield can be accurately derived by a simple calculation using the proposed model. Monte-Carlo simulation targeting 65nm and 28nm process technology models demonstrates the accuracy and the validity of the proposed method. Measurement results obtained by a test chip fabricated in a 65nm process technology also demonstrate the validity. Based on the model, this paper shows some strategies for variation tolerant design of latches.</p>
Journal
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- IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences
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IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences E99.A (12), 2463-2472, 2016
The Institute of Electronics, Information and Communication Engineers
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Keywords
Details 詳細情報について
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- CRID
- 1390282681288869760
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- NII Article ID
- 130005170525
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- ISSN
- 17451337
- 09168508
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- HANDLE
- 2433/252331
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- Text Lang
- en
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- Data Source
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- JaLC
- IRDB
- Crossref
- CiNii Articles
- KAKEN
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- Abstract License Flag
- Disallowed