Anisotropic Analysis of Nanocrystalline Bismuth Telluride Thin Films Treated by Homogeneous Electron Beam Irradiation
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- Kudo Shohei
- Department of Materials Science, Tokai University
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- Tanaka Saburo
- Department of Mechanical Engineering, College of Engineering, Nihon University
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- Miyazaki Koji
- Department of Mechanical and Control Engineering, Kyushu Institute of Technology
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- Nishi Yoshitake
- Department of Materials Science, Tokai University
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- Takashiri Masayuki
- Department of Materials Science, Tokai University
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<p>The in-plane and cross-plane transport properties of nanocrystalline bismuth telluride (Bi2Te3) thin films were evaluated to analyze their anisotropic behavior. Bi2Te3 thin films were prepared via radio frequency (RF) magnetron sputtering, followed by a subsequent treatment of thermal annealing and homogeneous electron beam (EB) irradiation at various EB doses. The crystallographic properties of the thin films were determined by X-ray diffraction (XRD) analysis. It was determined that the crystal orientation (Lotgering factor; F value) of Bi2Te3 thin films can be controlled by homogeneous EB irradiation treatments, without resulting in crystal growth. The electrical conductivity and Seebeck coefficient were measured in the in-plane direction of the films, and the thermal conductivity was measured in the cross-plane direction using the 3ω method. The anisotropic analysis was performed by combining the F value of the thin films with a simple model based on the transport properties of the basal and lateral planes of single- and poly-crystal Bi2Te3. The electrical and thermal conductivities of the in-plane and cross-plane directions of the EB-irradiated thin films clearly differed; however, there was no significant difference between the Seebeck coefficient values of the two planes. Finally, we determined that the figure of merit, ZT, was enhanced by the homogeneous EB irradiation treatment, and the in-plane ZT value was 25% greater than that of the cross-plane direction.</p>
収録刊行物
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- MATERIALS TRANSACTIONS
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MATERIALS TRANSACTIONS 58 (3), 513-519, 2017
公益社団法人 日本金属学会
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詳細情報 詳細情報について
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- CRID
- 1390001204254068480
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- NII論文ID
- 130005397740
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- NII書誌ID
- AA1151294X
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- ISSN
- 13475320
- 13459678
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- NDL書誌ID
- 028017686
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- 本文言語コード
- en
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- データソース種別
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- JaLC
- NDL
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