Observation of exciton polaritons in a ZnO microcavity with HfO2/SiO2 distributed bragg reflectors

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  • Nakayama Masaaki
    Department of Applied Physics, Graduate School of Engineering, Osaka City University
  • Komura Shingo
    Department of Applied Physics, Graduate School of Engineering, Osaka City University
  • Kawase Toshiki
    Department of Applied Physics, Graduate School of Engineering, Osaka City University
  • Kim DaeGwi
    Department of Applied Physics, Graduate School of Engineering, Osaka City University

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  • Observation of Exciton Polaritons in a ZnO Microcavity with HfO<SUB>2</SUB>/SiO<SUB>2</SUB> Distributed Bragg Reflectors

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We have investigated the characteristics of the exciton polaritons in a ZnO microcavity. The microcavity consists of an effective one-wavelength thick ZnO active layer and HfO2/SiO2 distributed Bragg reflectors (DBRs) at the bottom and top. We adopted rf magnetron sputtering and pulsed laser deposition for the preparation of the DBR and ZnO layer, respectively. Angle-resolved reflectance and photoluminescence spectra demonstrate the formation of the cavity polaritons. The cavity polariton dispersions are analyzed using a phenomenological Hamiltonian for the coupling between the cavity photon and three kinds of fundamental excitons labeled A, B, and C. The vacuum Rabi splitting energy is estimated to be ∼80 meV. The giant Rabi splitting energy reflects the large exciton oscillator strength of ZnO.

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