iPS細胞位相差顕微鏡画像のテクスチャ解析による品質評価
Journal
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- Tohoku-Section Joint Convention Record of Institutes of Electrical and Information Engineers, Japan
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Tohoku-Section Joint Convention Record of Institutes of Electrical and Information Engineers, Japan 2014 (0), 211-211, 2014
Organizing Committee of Tohoku-Section Joint Convention of Institutes of Electrical and Information Engineers, Japan
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Details 詳細情報について
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- CRID
- 1390282680621447936
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- NII Article ID
- 130005478650
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- Text Lang
- ja
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- Data Source
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- JaLC
- CiNii Articles