Synthesis and Property of Tellurium-Containing Polymer for Extreme Ultraviolet Resist Material
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- Fukunaga Mari
- Faculty of Chemistry, Materials and Bioengineering, Kansai University
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- Yamamoto Hiroki
- Institute of Scientific and Industrial Research, Osaka University
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- Kozawa Takahiro
- Institute of Scientific and Industrial Research, Osaka University
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- Watanabe Takeo
- Center for EUVL, LASTI, University of Hyogo
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- Kudo Hiroto
- Faculty of Chemistry, Materials and Bioengineering, Kansai University
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Synthesis, physical properties, and resist properties of tellurium containing polymer with pendant adamantyl ester groups poly(Re-co-Te)-AD were examined, relevant to the application of resist material for extreme ultraviolet laser photolithography (EUVL) system. A tellurium containing polymer with pendant hydroxyl groups poly(Re-co-Te) was synthesized by the condensation reaction of resorcinol (Re) and tellurium tetrachloride (TeCl4), followed by the condensation reaction with adamantyl bromo acetate to give a corresponding polymer poly(Re-co-Te)-AD. Their physical properties (solubility, film-forming ability, thermal stability) and resist properties (thickness loss property after soaking in 2.38 wt% TMAH aq. solution, out-gassing on EUV exposure tool, and resist sensitivity under EUV exposure tool) were also examined.
収録刊行物
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- Journal of Photopolymer Science and Technology
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Journal of Photopolymer Science and Technology 30 (1), 103-107, 2017
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詳細情報 詳細情報について
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- CRID
- 1390282679300892416
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- NII論文ID
- 130005950306
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- NII書誌ID
- AA11576862
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- ISSN
- 13496336
- 09149244
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- HANDLE
- 10112/16257
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- NDL書誌ID
- 028336456
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- 本文言語コード
- en
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- データソース種別
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- JaLC
- IRDB
- NDL
- Crossref
- CiNii Articles
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- 抄録ライセンスフラグ
- 使用不可