A Necessary and Sufficient Condition of Supply and Threshold Voltages in CMOS Circuits for Minimum Energy Point Operation

• SHIOMI Jun

  Department of Communications and Computer Engineering, Kyoto University

• ISHIHARA Tohru

  Department of Communications and Computer Engineering, Kyoto University

• ONODERA Hidetoshi

  Department of Communications and Computer Engineering, Kyoto University

Abstract

Scaling supply voltage (V_DD) and threshold voltage (V_th) dynamically has a strong impact on energy efficiency of CMOS LSI circuits. Techniques for optimizing V_DD and V_th simultaneously under dynamic workloads are thus widely investigated over the past 15 years. In this paper, we refer to the optimum pair of V_DD and V_th, which minimizes the energy consumption of a circuit under a specific performance constraint, as a minimum energy point (MEP). Based on the simple transregional models of a CMOS circuit, this paper derives a simple necessary and sufficient condition for the MEP operation. The simple condition helps find the MEP of CMOS circuits. Measurement results using standard-cell based memories (SCMs) fabricated in a 65-nm process technology also validate the condition derived in this paper.

Journal

• IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences

  IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences E100.A (12), 2764-2775, 2017

  The Institute of Electronics, Information and Communication Engineers

Keywords

• minimum energy point tracking (MEPT)
• dynamic voltage and frequency scaling (DVFS)
• adaptive body biasing (ABB)
• standard-cell based memory (SCM)

Details

• CRID: 1390282681291652736
• NII Article ID: 130006236534
• DOI: 10.1587/transfun.e100.a.2764
• ISSN: 17451337
• ISSN: 09168508
• Web Site: https://www.jstage.jst.go.jp/article/transfun/E100.A/12/E100.A_2764/_pdf
• Text Lang: en
• Data Source:
  • JaLC
  • Crossref
  • CiNii Articles
  • KAKEN
• Abstract License Flag: Disallowed