Epitaxial growth and structure of monolayer cerium oxide film on Rh(111)  [in Japanese] Epitaxial growth and structure of monolayer cerium oxide film on Rh(111)  [in Japanese]

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Abstract

<p>We prepare monolayer cerium (Ce) oxide film on Rh(111) in order to investigate the structure using scanning tunneling microscopy (STM), low-energy electron diffraction, X-ray photoemission spectroscopy (XPS), and density functional theory calculations. For the quantitative analysis of the Ce-oxide film, XPS in combination with Rutherford backscattering spectroscopy is used to determine the integral amount of cerium and oxygen atoms and the chemical states in the Ce-oxide film. The STM image is compared with simulated STM images in order to identify the appropriate structural model.</p>

<p>We prepare monolayer cerium (Ce) oxide film on Rh(111) in order to investigate the structure using scanning tunneling microscopy (STM), low-energy electron diffraction, X-ray photoemission spectroscopy (XPS), and density functional theory calculations. For the quantitative analysis of the Ce-oxide film, XPS in combination with Rutherford backscattering spectroscopy is used to determine the integral amount of cerium and oxygen atoms and the chemical states in the Ce-oxide film. The STM image is compared with simulated STM images in order to identify the appropriate structural model.</p>

Journal

  • Meeting Abstracts of the Physical Society of Japan

    Meeting Abstracts of the Physical Society of Japan 71.2(0), 2320-2320, 2016

    The Physical Society of Japan

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