Visualization of Localized Field Using Deflection of Low-Energy Electron Beam with SEM/STEM

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  • FUJITA Jun-ichi
    Institute of Applied Physics, Graduate School of Pure and Applied Science, University of Tsukuba

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  • 低加速電子線SEM/STEMを用いた局在場可視化技術
  • テイカソク デンシセン SEM/STEM オ モチイタ キョクザイジョウ カシカ ギジュツ

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Abstract

　High-sensitive visualization of the local electric and magnetic field is possible using a low energy electron beam combining with a simple grid detector configuration. The beam deflection goes along with the clear principle that the larger deflection can be induced by lower energy electron based on the Rutherford scattering scheme. The field distribution around two-dimensional materials allows quantitative analysis of the local field, showing good agreements with FEM simulation. Well defined beam scanning control established in the recent scanning electron microscope (SEM) can project the detector grid image superimposed on the specimen image. And thus the localized field distribution was easily visualized through a simple E-filed vector translation based on the deflection configuration. Detailed techniques and the analysis were described from the viewpoint of practical applications.<br>

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